ADDITIVE MANUFACTURING QUALITY CONTROL SYSTEMS

专利名称：ADDITIVE MANUFACTURING QUALITY

CONTROL SYSTEMS

发明人：GIULIETTI, Diana,VERSLUYS, Kiley J.申请号：EP16195238.7申请日：20161024公开号：EP3168702A1公开日：20170517

专利附图：

摘要：A method 100 includes receiving 101 an image from an optical imaging device(207) disposed in operative communication with an additive manufacturing machine (200),wherein the image includes at least part of a build area (205) of the additive

manufacturing machine, determining (103) a reflectance of at least a portion of the buildarea based on the image to create reflectance data, and determining (105) a quality ofone or more of an additive manufacturing process and/or product based on the

reflectance data. The method can further include converting the image to greyscale if theimage is not in greyscale.

申请人：Hamilton Sundstrand Corporation

地址：Four Coliseum Centre, 2730 West Tyvola Road, Charlotte, NC 28217 US

国籍：US

代理机构：Stevens, Jason Paul

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