Fine particle measuring device

专利名称：Fine particle measuring device发明人：Mitsuru Toishi,Katsuhiro Seo,Koji

Takasaki,Shinji Yamada,Atsushi Fukumoto

申请号：US13180740申请日：20110712公开号：US084635B2公开日：20130618

专利附图：

摘要：A fine particle measuring device includes an optical filter that is divided into aplurality of areas and is disposed on an optical path on which light emitted from a fineparticle, which is irradiated with light, is guided to an optical detector. In the fine particle

measuring device, the optical filter includes a first area having wavelength selectivity bywhich the first area blocks reflected light from the fine particle and an unnecessaryscattered light component and transmits fluorescence, and a second area that is

disposed around at least the first area and has no wavelength selectivity so as to transmita necessary scattered light component.

申请人：Mitsuru Toishi,Katsuhiro Seo,Koji Takasaki,Shinji Yamada,Atsushi Fukumoto

地址：Kanagawa JP,Kanagawa JP,Chiba JP,Kanagawa JP,Kanagawa JP

国籍：JP,JP,JP,JP,JP

代理机构：K&L Gates LLP

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